Series XL-750 / 770 / 770-VF Bench Micrometers

Product Details

Designed for high-performance thickness inspection of film and foil, these systems provide very high resolution and accuracy. Resolution to ten millionths of an inch with accuracy to 12.5 microinches. Air-actuated LVDT contact sensor allows variable gaging force settings. Proprietary "floating anvil" eliminates parallelism error. Push-button zero.

Add to Quote